SUBPART B—Procedures for Stationary Lot Sampling and Inspection (§42.103 to §42.113)
- 42.103—Purpose and scope.
- 42.104—Sampling plans and defects.
- 42.105—Basis for selection of sample.
- 42.106—Classifying and recording defects.
- 42.107—Lot acceptance criteria.
- 42.108—Normal, tightened, or reduced inspection.
- 42.109—Sampling plans for normal condition of container inspection, Tables I and I-A.
- 42.110—Sampling plans for tightened condition of container inspection; Tables II and II-A.
- 42.111—Sampling plans for reduced condition of container inspection, Tables III and III-A; and limit number for reduced inspection, Table III-B.
- 42.112—Defects of containers: Tables IV, V, VI, and VII.
- 42.113—Defects of label, marking, or code; Table VIII.