32.103—Schedule D—prototype tests for ice detection devices containing strontium-90.
An applicant for a license pursuant to § 32.61 shall conduct prototype tests on each of five prototype ice detection devices as follows:
(a) Temperature-altitude test.
The device shall be placed in a test chamber as it would be used in service. A temperature-altitude condition schedule shall be followed as outlined in Step 1 through Step 10 of § 32.101(a).
(d) Hermetic seal and waterproof test.
On completion of all other tests prescribed by this section, the device shall be immersed in 30 inches of water for 24 hours and shall show no visible evidence of physical contact between the water and the strontium-90. Absolute pressure of the air above the water shall then be reduced to 1 inch of mercury. Lowered pressure shall be maintained for 1 minute or until air bubbles cease to be given off by the water, whichever is the longer. Pressure shall then be increased to normal atmospheric pressure. Any visible evidence of physical contact between the water and the strontium-90 shall be considered leakage.
(e) Observations.
After each of the tests prescribed by this section, each device shall be examined for evidence of physical damage and for loss of strontium-90. Any evidence of leakage or damage to or failure of any device which could affect containment of the strontium-90 shall be cause for rejection of the design if the damage or failure is attributable to a design defect. Loss of strontium-90 from each tested device shall be measured by wiping with filter paper an area of at least 100 square centimeters on the outside surface of the device, or by wiping the entire surface area if it is less than 100 square centimeters. The amount of strontium-90 in the water used in the hermetic seal and waterproof test prescribed in paragraph (d) of this section shall also be measured. The detection on the filter paper of more than 2,200 disintegrations per minute of strontium-90 per 100 square centimeters of surface wiped or in the water of more than 0.1 percent of the original amount of strontium-90 in any device, shall be cause for rejection of the tested device.